7-25B AOI Process Control for IC Substrates Standard Task Group

Chair Feng Xue, IBM Infrastructure
Staff Liaison
Committee Charter This task group is developing IPC-9712, Requirements for Automated Optical Inspection (AOI) Process Control for Integrated Chip Substrates. This standard will provide requirements for automated inspection systems to define, set-up, establish and apply process control for manufacturing integrated chip substrates, including general and specific process and equipment conditions. Requirements will include those for operating and inspection parameters, vision systems, lighting conditions, calibration, detectability, resolution, threshold limits and process windows, program setups, measurement system analysis (MSA), maintenance and verification protocols.
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